Akrometrix Announces New DFP2-LS Room Temperature System
ATLANTA, GA ― August 11th, 2022 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, announces its Digital Fringe Projection End-of-Line Room Temperature system (DFP2-LS).
The days of measuring coplanarity with mechanical shim gauges at a few select points are gone. With the DFP2-LS, coplanarity is measured across the entire surface of a fully populated PCB assembly after the reflow process. In the case of the DFP2-LS, the D.U.T can be a PCB as large as 585mm x 468mm, where the entire surface is measured in a matter of seconds, not minutes.
The DFP2-LS is paired with an SMT production version of Akrometrix Studio software which includes the Surface Measurement, Part Tracking, and Real-Time Analysis capabilities which can set pass/fail parameters, and capture data for every PCB assembly tested, and store the entire library of units tested.
For more information about the DFP2-LS, download our product brochure and technical specifications.
Akrometrix is the industry leader in real-time metrology at all levels of electronic materials production, components fabrication, and assembly processes. Our systems utilize Shadow Moiré, with the capability to utilize our add-on Digital Fringe Projection and Digital Image Correlation optical metrology technologies.
Our applications engineering experts are happy to provide you with accurate and timely information for all your Thermal Warpage and Strain Metrology needs. For more information about Akrometrix’s warpage metrology systems, email us at equipmentsales@akrometrix.com or visit www.akrometrix.com.