The TTSM-JS provides ultra fast surface topography for up to two JEDEC trays full of samples. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM-JS is designed for those customers who need to measure various substrates for warpage in less than 2 seconds. Akrometrix’s suite of software programs to allow for a variety of useful features to optimize and provide meaningful reports.

The TTSM-JS features single push button activation for loading and measurement, as wall as scanning capabilities for QR codes, Barcodes, and Data Matrices.