Akrometrix Announces New TTSM-JS Room Temperature System
ATLANTA, GA ― August 11th, 2022 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries announces its Table Top Shadow Moiré Room Temperature System with JEDEC Tray Autoloader & scanner (TTSM-JS.)
The TTSM-JS provides ultra-fast surface topography for up to two JEDEC trays full of samples. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM-JS is designed for those customers who need to measure various substrates for warpage in less than 2 seconds. Akrometrix’s suite of software programs allows for a variety of useful features to optimize and provide meaningful reports.
The TTSM-JS features single push button activation for loading and measurement, as well as scanning capabilities for QR codes, barcodes, and data matrices.
For more information about the TTSM-JS, download our product brochure and technical specifications.
Akrometrix is the industry leader in real-time metrology at all levels of electronic materials production, components fabrication, and assembly processes. Our systems utilize Shadow Moiré, with the capability to utilize our add-on Digital Fringe Projection and Digital Image Correlation optical metrology technologies.
Our applications engineering experts are happy to provide you with accurate and timely information for all your Thermal Warpage and Strain Metrology needs. For more information about Akrometrix’s warpage metrology systems, email us at equipmentsales@akrometrix.com or visit www.akrometrix.com.