https://akrometrix.com equipmentsales@akrometrix.com | +1 404 486 0880 Tue, 24 Mar 2026 16:10:01 +0000 en-US hourly 1 https://akrometrix.com/wp-content/uploads/2019/04/site-icon-150x150.png https://akrometrix.com 32 32 https://akrometrix.com/new-studio-10-1-software-release-and-updates/ Wed, 14 Jan 2026 22:01:10 +0000 https://akrometrix.com/?p=8237 Akrometrix Studio Version 10.1 Release ATLANTA, GA ― January 14th, 2026 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, announces their new Studio 10.1 update. Akrometrix Studio version 10.1 is now available and introduces: Profile gauges for validating reflow emulation against […]

The post New Studio 10.1 Software Release and Updates first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-announces-next-generation-thermal-warpage-measurement-tool-the-ps600t/ Fri, 29 Aug 2025 20:47:30 +0000 https://akrometrix.com/?p=7351 Akrometrix Announces Next Generation Thermal Warpage Measurement Tool the PS600T ATLANTA, GA ― August 29, 2025 ― Akrometrix, LLC -the leading provider of Thermal Warpage and Strain Metrology Equipment for semiconductor and electronics industries, recently announced the next generation in thermal warpage metrology with its PS600T system.  This system greatly improves temperature uniformity and heating […]

The post Akrometrix Announces Next Generation Thermal Warpage Measurement Tool the PS600T first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-llc-reports-a-record-year-of-revenue-for-2024/ Tue, 04 Mar 2025 21:12:52 +0000 https://akrometrix.com/?p=7320 Akrometrix LLC Reports a Record Year of Revenue for 2024 Atlanta, GA ― March 4, 2025 ― Akrometrix LLC, The global leader in Thermal Warpage Metrology, announces financial results for the full year 2024. “We are pleased to report outstanding performance in both Engineering Development and Global Sales for the full year, again resulting in all-time […]

The post Akrometrix LLC Reports a Record Year of Revenue for 2024 first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-announces-new-thermoire-axp3/ Sun, 02 Mar 2025 15:31:18 +0000 https://akrometrix.com/?p=6369 Akrometrix Announces Next Generation Thermal Warpage Measurement System AXP3 Atlanta, Georgia – Akrometrix, LLC, the leading provider of Thermal Warpage and Strain Metrology Equipment for semiconductor and electronics industries, recently announced the next generation in thermal warpage metrology with its AXP3 system. This system expands on the widely used shadow moiré technology by bringing the […]

The post Akrometrix Announces AXP3 first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-announces-30-year-anniversary-as-the-industry-leader-in-thermal-warpage-metrology/ Tue, 18 Feb 2025 22:58:00 +0000 https://akrometrix.com/?p=7314 Akrometrix Announces 30 Year Anniversary as the Industry Leader in Thermal Warpage Metrology ATLANTA, GA ― February 18, 2025 ― Professor Ifeanyi Charles Ume founded Akrometrix out of Georgia Tech 30 years ago, to address issues in PCB flatness, using the shadow moiré warpage measurement technique. These early concepts evolved into industry standards for measuring […]

The post Akrometrix Announces 30 Year Anniversary as the Industry Leader in Thermal Warpage Metrology first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-announces-new-studio-9-0-software-update/ Thu, 11 Aug 2022 21:27:43 +0000 https://akrometrix.com/?p=5700 New Studio 9.0 Software Release and Updates ATLANTA, GA ― August 11th, 2022 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, announces their new Studio 9.0 update.Akrometrix Studio Software 9.0 introduces key bug fixes to the previous 8.6 release, with […]

The post New Studio 9.0 Software Release and Updates first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-is-featured-on-behind-the-scenes-on-pbs/ Thu, 11 Aug 2022 21:20:11 +0000 https://akrometrix.com/?p=5699 Behind the Scenes Features Akrometrix On TV ATLANTA, GA ― August 11th, 2022 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, announces their featured segment on Behind the Scenes with Laurence Fishburne. Behind the Scenes with Laurence Fishburne is an […]

The post Behind the Scenes Featuring Akrometrix on TV first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-announces-new-ttdfp2-room-temperature-system/ Thu, 11 Aug 2022 21:03:23 +0000 https://akrometrix.com/?p=5690 New TTDFP2 Room Temperature System ATLANTA, GA ― August 11st, 2022 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced its Table Top Digital Fringe Projection 2 Room Temperature System (TTDFP2). The TTDFP2 provides fast and accurate surface topography […]

The post New TTDFP2 Room Temperature System first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-announces-new-dfp2-ls-room-temperature-system/ Thu, 11 Aug 2022 20:53:18 +0000 https://akrometrix.com/?p=5684 Akrometrix Announces New DFP2-LS Room Temperature System ATLANTA, GA ― August 11th, 2022 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, announces its Digital Fringe Projection End-of-Line Room Temperature system (DFP2-LS). The days of measuring coplanarity with mechanical shim gauges […]

The post Akrometrix Announces New DFP2-LS Room Temperature System first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-announces-new-axp-2-0-dfp2-warpage-system/ Thu, 11 Aug 2022 20:12:38 +0000 https://akrometrix.com/?p=5698 Akrometrix Announces New AXP 2.0-DFP2 Warpage System ATLANTA, GA ― August 11th, 2022 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced its AXP 2.0 Thermal Warpage System with Second Generation Digital Fringe Projection Vision Technology (AXP-DFP2.) The AXP2.0-DFP2 […]

The post Akrometrix Announces New AXP 2.0-DFP2 System first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-announces-new-ttsm-js-room-temperature-system/ Thu, 11 Aug 2022 19:49:20 +0000 https://akrometrix.com/?p=5661 Akrometrix Announces New TTSM-JS Room Temperature System ATLANTA, GA ― August 11th, 2022 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries announces its Table Top Shadow Moiré Room Temperature System with JEDEC Tray Autoloader & scanner (TTSM-JS.) The TTSM-JS provides […]

The post Akrometrix Announces New TTSM-JS Room Temperature System first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-announces-new-axp-2-0-dic-warpage-system/ Fri, 22 Jul 2022 15:11:25 +0000 https://akrometrix.com/?p=5550 Akrometrix Announces New AXP 2.0-DIC Warpage System ATLANTA, GA ― August 11th, 2022 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries announces its AXP 2.0 Thermal Warpage System with Second Generation Digital Image Correlation Vision Technology (AXP 2.0-DIC.) The AXP […]

The post Akrometrix Announces New AXP 2.0-DIC Warpage System first appeared on Akrometrix.]]> https://akrometrix.com/akrometrix-wins-2017-npi-award/ Wed, 15 Feb 2017 20:24:24 +0000 https://akrometrix.com/?p=1099 Akrometrix Wins a 2017 NPI Award for Its Next Generation AXP Shadow Moiré System at APEX ATLANTA, GA ― February 15 2017 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, is pleased to announce that it has been awarded a […]

The post Akrometrix Wins a 2017 NPI Award for Its Next Generation AXP Shadow Moiré System at APEX first appeared on Akrometrix.]]> https://akrometrix.com/next-generation-axp-system/ Mon, 03 Oct 2016 20:25:40 +0000 https://akrometrix.com/?p=994 Akrometrix Announces Next Generation AXP Shadow Moiré System ATLANTA, GA ― October 3, 2016 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced its next-generation Shadow Moiré System – the AXP 2.0. Akrometrix has been supplying thermal warpage systems […]

The post Akrometrix Announces Next Generation AXP Shadow Moiré System first appeared on Akrometrix.]]> https://akrometrix.com/new-schedule-technical-presentations/ https://akrometrix.com/new-schedule-technical-presentations/#comments Wed, 21 Sep 2016 15:41:24 +0000 https://akrometrix.com/?p=987 Akrometrix Announces New Schedule for Technical Presentations ATLANTA, GA ― September 21, 2016 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced its upcoming schedule for technical presentations: SMTA International 2016 in Rosemont IL (Sept. 25-29, 2016): “Understanding PCB […]

The post Akrometrix Announces New Schedule for Technical Presentations first appeared on Akrometrix.]]> https://akrometrix.com/new-schedule-technical-presentations/feed/ 97 https://akrometrix.com/cre6-convection-reflow-emulation/ https://akrometrix.com/cre6-convection-reflow-emulation/#comments Wed, 04 May 2016 18:58:51 +0000 https://akrometrix.com/?p=882 Akrometrix Announces the Release of the CRE6, Convection Reflow Emulation for Warpage Metrology ATLANTA, GA ― May 4, 2016 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced that the company released its next-generation Convection Reflow Emulation Module (CRE6) […]

The post Akrometrix Releases the CRE6, Convection Reflow Emulation Module first appeared on Akrometrix.]]> https://akrometrix.com/cre6-convection-reflow-emulation/feed/ 85 https://akrometrix.com/300th-shadow-moire-system/ https://akrometrix.com/300th-shadow-moire-system/#comments Thu, 28 Apr 2016 18:56:22 +0000 https://akrometrix.com/?p=880 Akrometrix Announces the Shipment of Its 300th Shadow Moiré System ATLANTA, GA ― April 28, 2016 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced that the company has shipped its 300th shadow moiré metrology system to a leading […]

The post Akrometrix Announces the Shipment of Its 300th Shadow Moiré System first appeared on Akrometrix.]]> https://akrometrix.com/300th-shadow-moire-system/feed/ 87 https://akrometrix.com/automated-die-attach-tilt-metrology/ https://akrometrix.com/automated-die-attach-tilt-metrology/#comments Thu, 14 Apr 2016 17:38:21 +0000 https://akrometrix.com/?p=612 Akrometrix Announces Automated Die Attach Tilt Metrology ATLANTA, GA ― February 2016 ― Akrometrix LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced that it has developed an automated die-board (or daughter-mother board) attach tilt metrology. All Akrometrix shadow moiré or […]

The post Akrometrix Announces Automated Die Attach Tilt Metrology first appeared on Akrometrix.]]> https://akrometrix.com/automated-die-attach-tilt-metrology/feed/ 73 https://akrometrix.com/enhanced-digital-image-correlation-dic-module/ https://akrometrix.com/enhanced-digital-image-correlation-dic-module/#comments Wed, 30 Mar 2016 19:56:25 +0000 https://akrometrix.com/?p=688 Akrometrix Announces Enhanced Digital Image Correlation (DIC) Module ATLANTA, GA ― March 2016 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics packaging industries, today introduced the latest generation Digital Image Correlation (DIC) module for both its AXP and PS200 platforms. DIC […]

The post Akrometrix Announces Enhanced Digital Image Correlation (DIC) Module first appeared on Akrometrix.]]> https://akrometrix.com/enhanced-digital-image-correlation-dic-module/feed/ 75 https://akrometrix.com/convection-reflow-emulation-module/ https://akrometrix.com/convection-reflow-emulation-module/#comments Wed, 22 Jan 2014 21:23:37 +0000 https://akrometrix.com/?p=44 Akrometrix Announces the Release of the CRE6, Convection Reflow Emulation for Warpage Metrology Akrometrix LLC, the leader in elevated temperature surface characterization, has announced the availability of the CONVECTION REFLOW EMULATION (CRE) Module, the next generation add-on module for the TherMoiré AXP powered by Studio Software. The CRE Module addresses the semiconductor industry requirement for […]

The post Akrometrix Announces Convection Reflow Emulation (CRE) Module Release first appeared on Akrometrix.]]> https://akrometrix.com/convection-reflow-emulation-module/feed/ 74