{"id":8564,"date":"2025-12-11T10:53:00","date_gmt":"2025-12-11T15:53:00","guid":{"rendered":"https:\/\/akrometrix.com\/staging1\/?p=8564"},"modified":"2026-03-24T10:53:37","modified_gmt":"2026-03-24T14:53:37","slug":"akrometrix-announces-next-generation-thermal-strain-measurement-tool-the-dic3","status":"publish","type":"post","link":"https:\/\/akrometrix.com\/staging1\/akrometrix-announces-next-generation-thermal-strain-measurement-tool-the-dic3\/","title":{"rendered":"Akrometrix Announces Next Generation Thermal Strain Measurement Tool the DIC3"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-post\" data-elementor-id=\"8564\" class=\"elementor elementor-8564\">\n\t\t\t\t<div class=\"elementor-element elementor-element-4f17f834 e-flex e-con-boxed e-con e-parent\" data-id=\"4f17f834\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;,&quot;animation&quot;:&quot;none&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-711e880c e-con-full e-flex e-con e-child\" data-id=\"711e880c\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-3eed5dcb elementor-widget elementor-widget-heading\" data-id=\"3eed5dcb\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h1 class=\"elementor-heading-title elementor-size-medium\">Akrometrix Announces Next Generation Thermal Strain and CTE Measurement Tool the DIC3 Module<\/h1>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-017ac16 e-con-full e-flex e-con e-parent\" data-id=\"017ac16\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-6897965 e-flex e-con-boxed e-con e-child\" data-id=\"6897965\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-71245dc elementor-widget elementor-widget-image\" data-id=\"71245dc\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" decoding=\"async\" width=\"1024\" height=\"768\" src=\"https:\/\/akrometrix.com\/staging1\/wp-content\/uploads\/2025\/12\/DIC3-Clear-Background-1024x768.webp\" class=\"attachment-large size-large wp-image-8720\" alt=\"\" srcset=\"https:\/\/akrometrix.com\/staging1\/wp-content\/uploads\/2025\/12\/DIC3-Clear-Background-1024x768.webp 1024w, https:\/\/akrometrix.com\/staging1\/wp-content\/uploads\/2025\/12\/DIC3-Clear-Background-300x225.webp 300w, https:\/\/akrometrix.com\/staging1\/wp-content\/uploads\/2025\/12\/DIC3-Clear-Background-768x576.webp 768w, https:\/\/akrometrix.com\/staging1\/wp-content\/uploads\/2025\/12\/DIC3-Clear-Background-1536x1152.webp 1536w, https:\/\/akrometrix.com\/staging1\/wp-content\/uploads\/2025\/12\/DIC3-Clear-Background-2048x1536.webp 2048w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b280706 e-flex e-con-boxed e-con e-child\" data-id=\"b280706\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-2828b608 elementor-widget elementor-widget-text-editor\" data-id=\"2828b608\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong>ATLANTA, GA \u2015 <\/strong><strong>December 11, 2026 <\/strong><strong>\u2015<\/strong> Akrometrix, LLC,<\/p><p>the leading provider of Thermal Warpage and Strain Metrology Equipment for semiconductor and electronics industries, recently announced the next generation in thermal strain metrology with its DIC3 module.\u00a0 The tool significantly improves data density and expands the available field of view, delivering more accurate strain and CTE measurements for a wider range of part sizes under emulated reflow conditions.<\/p><p>This add-on module extends the capabilities of the AXP and PS600 systems with digital image correlation (DIC), the industry standard for strain and CTE measurements. The DIC3 module features four 18.4MP cameras with automated lens control, allowing strain measurements of samples areas from 3x3mm to 225x205mm and delivers 4s down to 0.5 microns in the x\u2013y axis and 100 microstrain. DIC3 is backward compatible with existing AXP 2.0 and PS600S systems. When paired with AXP 2.0, AXP3, or PS600T, it can be configured with a module autoloader for additional automation.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-78acaf0 elementor-mobile-align-center elementor-hidden-tablet elementor-hidden-mobile elementor-align-center elementor-widget elementor-widget-button\" data-id=\"78acaf0\" data-element_type=\"widget\" data-widget_type=\"button.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<div class=\"elementor-button-wrapper\">\n\t\t\t\t\t<a class=\"elementor-button elementor-button-link elementor-size-lg\" href=\"https:\/\/akrometrix.com\/staging1\/wp-content\/uploads\/2025\/12\/DIC_Handout2025.pdf\" target=\"_blank\">\n\t\t\t\t\t\t<span class=\"elementor-button-content-wrapper\">\n\t\t\t\t\t\t<span class=\"elementor-button-icon\">\n\t\t\t\t<svg aria-hidden=\"true\" class=\"e-font-icon-svg e-far-file-pdf\" viewBox=\"0 0 384 512\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\"><path d=\"M369.9 97.9L286 14C277 5 264.8-.1 252.1-.1H48C21.5 0 0 21.5 0 48v416c0 26.5 21.5 48 48 48h288c26.5 0 48-21.5 48-48V131.9c0-12.7-5.1-25-14.1-34zM332.1 128H256V51.9l76.1 76.1zM48 464V48h160v104c0 13.3 10.7 24 24 24h104v288H48zm250.2-143.7c-12.2-12-47-8.7-64.4-6.5-17.2-10.5-28.7-25-36.8-46.3 3.9-16.1 10.1-40.6 5.4-56-4.2-26.2-37.8-23.6-42.6-5.9-4.4 16.1-.4 38.5 7 67.1-10 23.9-24.9 56-35.4 74.4-20 10.3-47 26.2-51 46.2-3.3 15.8 26 55.2 76.1-31.2 22.4-7.4 46.8-16.5 68.4-20.1 18.9 10.2 41 17 55.8 17 25.5 0 28-28.2 17.5-38.7zm-198.1 77.8c5.1-13.7 24.5-29.5 30.4-35-19 30.3-30.4 35.7-30.4 35zm81.6-190.6c7.4 0 6.7 32.1 1.8 40.8-4.4-13.9-4.3-40.8-1.8-40.8zm-24.4 136.6c9.7-16.9 18-37 24.7-54.7 8.3 15.1 18.9 27.2 30.1 35.5-20.8 4.3-38.9 13.1-54.8 19.2zm131.6-5s-5 6-37.3-7.8c35.1-2.6 40.9 5.4 37.3 7.8z\"><\/path><\/svg>\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t<span class=\"elementor-button-text\">Technical Specs<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-0aae1f0 elementor-widget elementor-widget-text-editor\" data-id=\"0aae1f0\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>\u00a0<\/p><hr \/><div class=\"elementor-element elementor-element-99beca7 elementor-widget elementor-widget-text-editor\" data-id=\"99beca7\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><p>Akrometrix is the industry leader in real-time metrology at all levels of electronic materials production, components fabrication, and assembly processes.\u00a0<a href=\"https:\/\/akrometrix.com\/staging1\/products\/\">Our systems<\/a>\u00a0utilize\u00a0<a href=\"https:\/\/akrometrix.com\/staging1\/measurement-vision-technologies\/#VT_SM\">Shadow Moir\u00e9 Vision Technology<\/a>, with the capability to utilize our add-on <a href=\"https:\/\/akrometrix.com\/staging1\/modules\/#DFP_M\">Digital Fringe Projection<\/a> and <a href=\"https:\/\/akrometrix.com\/staging1\/modules\/#DIC_M\">Digital Image Correlation<\/a> optical metrology technologies.<\/p><\/div><\/div><p>For more information about Akrometrix\u2019s warpage and strain metrology systems, including the DIC3 currently available for sale, please contact\u00a0<a href=\"mailto:sales@akrometrix.com\">sales@akrometrix.com<\/a><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Akrometrix Announces Next Generation Thermal Strain and CTE Measurement Tool the DIC3 Module ATLANTA, GA \u2015 December 11, 2026 \u2015 Akrometrix, LLC, the leading provider of Thermal Warpage and Strain Metrology Equipment for semiconductor and electronics industries, recently announced the next generation in thermal strain metrology with its DIC3 module.\u00a0 The tool significantly improves data [&hellip;]<\/p>\n","protected":false},"author":22,"featured_media":8721,"comment_status":"closed","ping_status":"open","sticky":false,"template":"elementor_header_footer","format":"standard","meta":{"site-sidebar-layout":"default","site-content-layout":"","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"set","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center 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