Akrometrix Studio Version 10.1 Release
ATLANTA, GA ― January 14th, 2026 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, announces their new Studio 10.1 update. Akrometrix Studio version 10.1 is now available and introduces:
- Profile gauges for validating reflow emulation against industry standards.
- New post-processing tools that enable targeted reduction of secondary interference effects when needed.
- Surface brightness mask that takes advantage of specific surface conditions to enhance post-processing workflows.
See the summary below or visit our Industries Standards and Downloads page for detailed release notes on more new features, bug fixes, and new systems and modules compatible with this software version.
Akrometrix is the industry leader in real-time metrology at all levels of electronic materials production, components fabrication, and assembly processes. Our systems utilize Shadow Moiré Vision Technology, with the capability to utilize our add-on Digital Fringe Projection and Digital Image Correlation optical metrology technologies.
Our applications engineering experts are happy to provide you with accurate and timely information for all your Thermal Warpage and Strain Metrology needs. For more information about Akrometrix’s warpage metrology systems and software, including Studio 10.1 please contact us at support@akrometrix.com.
