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		<title>New Studio 10.1 Software Release and Updates</title>
		<link>https://akrometrix.com/staging1/new-studio-10-1-software-release-and-updates/</link>
		
		<dc:creator><![CDATA[Tancredo Rocha]]></dc:creator>
		<pubDate>Wed, 14 Jan 2026 16:04:47 +0000</pubDate>
				<category><![CDATA[Press Releases]]></category>
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					<description><![CDATA[<p>Akrometrix Studio Version 10.1 Release ATLANTA, GA ― January 14th, 2026 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, announces their new Studio 10.1 update. Akrometrix Studio version 10.1 is now available and introduces: Profile gauges for validating reflow emulation against [&#8230;]</p>
The post <a href="https://akrometrix.com/staging1/new-studio-10-1-software-release-and-updates/">New Studio 10.1 Software Release and Updates</a> first appeared on <a href="https://akrometrix.com/staging1">Akrometrix</a>.]]></description>
		
		
		
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		<title>Akrometrix Announces the Next Generation Digital Fringe Projection Metrology Tool, the DFP3 Module</title>
		<link>https://akrometrix.com/staging1/akrometrix-announces-the-next-generation-digital-fringe-projection-metrology-tool-the-dfp3-module/</link>
		
		<dc:creator><![CDATA[Tancredo Rocha]]></dc:creator>
		<pubDate>Thu, 08 Jan 2026 16:04:49 +0000</pubDate>
				<category><![CDATA[Press Releases]]></category>
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					<description><![CDATA[<p>Akrometrix Announces the Next Generation Digital Fringe Projection Metrology Tool, the DFP3 Module ATLANTA, GA ― December 11, 2026 ― Akrometrix, LLC, the leading provider of Thermal Warpage and Strain Metrology Equipment for the semiconductor and electronics industries, recently announced the next generation in digital fringe projection (DFP) thermal warpage metrology with its DFP3 module.  [&#8230;]</p>
The post <a href="https://akrometrix.com/staging1/akrometrix-announces-the-next-generation-digital-fringe-projection-metrology-tool-the-dfp3-module/">Akrometrix Announces the Next Generation Digital Fringe Projection Metrology Tool, the DFP3 Module</a> first appeared on <a href="https://akrometrix.com/staging1">Akrometrix</a>.]]></description>
		
		
		
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		<title>Akrometrix Announces Next Generation Thermal Strain Measurement Tool the DIC3</title>
		<link>https://akrometrix.com/staging1/akrometrix-announces-next-generation-thermal-strain-measurement-tool-the-dic3/</link>
		
		<dc:creator><![CDATA[Tancredo Rocha]]></dc:creator>
		<pubDate>Thu, 11 Dec 2025 15:53:00 +0000</pubDate>
				<category><![CDATA[Press Releases]]></category>
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					<description><![CDATA[<p>Akrometrix Announces Next Generation Thermal Strain and CTE Measurement Tool the DIC3 Module ATLANTA, GA ― December 11, 2026 ― Akrometrix, LLC, the leading provider of Thermal Warpage and Strain Metrology Equipment for semiconductor and electronics industries, recently announced the next generation in thermal strain metrology with its DIC3 module.  The tool significantly improves data [&#8230;]</p>
The post <a href="https://akrometrix.com/staging1/akrometrix-announces-next-generation-thermal-strain-measurement-tool-the-dic3/">Akrometrix Announces Next Generation Thermal Strain Measurement Tool the DIC3</a> first appeared on <a href="https://akrometrix.com/staging1">Akrometrix</a>.]]></description>
		
		
		
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		<title>Akrometrix Announces Next Generation Thermal Warpage Measurement Tool the PS600T</title>
		<link>https://akrometrix.com/staging1/akrometrix-announces-new-dic3/</link>
		
		<dc:creator><![CDATA[Tancredo Rocha]]></dc:creator>
		<pubDate>Tue, 02 Sep 2025 20:47:30 +0000</pubDate>
				<category><![CDATA[Press Releases]]></category>
		<guid isPermaLink="false">https://akrometrix.com/?p=7351</guid>

					<description><![CDATA[<p>Akrometrix Announces Next Generation Thermal Warpage Measurement Tool the PS600T ATLANTA, GA ― August 29, 2025 ― Akrometrix, the leading provider of Thermal Warpage and Strain Metrology Equipment for semiconductor and electronics industries, recently announced the next generation in thermal warpage metrology with its PS600T system.  This system greatly improves temperature uniformity and heating rates, [&#8230;]</p>
The post <a href="https://akrometrix.com/staging1/akrometrix-announces-new-dic3/">Akrometrix Announces Next Generation Thermal Warpage Measurement Tool the PS600T</a> first appeared on <a href="https://akrometrix.com/staging1">Akrometrix</a>.]]></description>
		
		
		
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		<title>Akrometrix LLC Reports a Record Year of Revenue for 2024</title>
		<link>https://akrometrix.com/staging1/akrometrix-llc-reports-a-record-year-of-revenue-for-2024/</link>
		
		<dc:creator><![CDATA[Tancredo Rocha]]></dc:creator>
		<pubDate>Wed, 05 Mar 2025 21:12:52 +0000</pubDate>
				<category><![CDATA[Press Releases]]></category>
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					<description><![CDATA[<p>Akrometrix LLC Reports a Record Year of Revenue for 2024 Atlanta, GA ― March 4, 2025 ― Akrometrix LLC, The global leader in Thermal Warpage Metrology, announces financial results for the full year 2024. &#8220;We are pleased to report outstanding performance in both Engineering Development and Global Sales for the full year, again resulting in all-time [&#8230;]</p>
The post <a href="https://akrometrix.com/staging1/akrometrix-llc-reports-a-record-year-of-revenue-for-2024/">Akrometrix LLC Reports a Record Year of Revenue for 2024</a> first appeared on <a href="https://akrometrix.com/staging1">Akrometrix</a>.]]></description>
		
		
		
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		<title>Akrometrix Announces 30 Year Anniversary as the Industry Leader in Thermal Warpage Metrology</title>
		<link>https://akrometrix.com/staging1/akrometrix-announces-30-year-anniversary-as-the-industry-leader-in-thermal-warpage-metrology/</link>
		
		<dc:creator><![CDATA[Tancredo Rocha]]></dc:creator>
		<pubDate>Tue, 18 Feb 2025 22:58:00 +0000</pubDate>
				<category><![CDATA[Press Releases]]></category>
		<category><![CDATA[Industry leader]]></category>
		<category><![CDATA[metrology]]></category>
		<category><![CDATA[Thermal warpage]]></category>
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					<description><![CDATA[<p>Akrometrix Announces 30 Year Anniversary as the Industry Leader in Thermal Warpage Metrology ATLANTA, GA ― February 18, 2025 ― Professor Ifeanyi Charles Ume founded Akrometrix out of Georgia Tech 30 years ago, to address issues in PCB flatness, using the shadow moiré warpage measurement technique. These early concepts evolved into industry standards for measuring [&#8230;]</p>
The post <a href="https://akrometrix.com/staging1/akrometrix-announces-30-year-anniversary-as-the-industry-leader-in-thermal-warpage-metrology/">Akrometrix Announces 30 Year Anniversary as the Industry Leader in Thermal Warpage Metrology</a> first appeared on <a href="https://akrometrix.com/staging1">Akrometrix</a>.]]></description>
		
		
		
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