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# Akrometrix

equipmentsales@akrometrix.com | +1 404 486 0880

## Sitemaps

- [XML Sitemap](https://akrometrix.com/sitemap.xml): Contains all public & indexable URLs for this website.

## Posts

- [News Room](https://akrometrix.com/news-room/) - News Room for all scheduled events, blog posts, and product releases. Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions.

## Pages

- [Home](https://akrometrix.com/) - Akrometrix provides innovative industrial measurement and calibration solutions designed to improve accuracy, efficiency, and operational performance.
- [White Papers, Editorials, Videos & Technical Papers](https://akrometrix.com/white-papers-editorials-technical-papers/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [About Akrometrix](https://akrometrix.com/about/) - Learn about how Akrometrix has become the industry leader in real-time metrology, with over twenty five years of dedication and history to propel us forward.
- [News & Updates](https://akrometrix.com/news-and-updates/) - News Room for all scheduled events, blog posts, and product releases. Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions.
- [AXP 3](https://akrometrix.com/axp-3/) - AXP 3 Thermal Warpage System Technical Specs The TherMoiré® AXP 3 is a modular metrology solution that utilizes the Shadow Moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400 mm x 400 mm. With time-temperature profiling capability, the TherMoiré® AXP 3 captures a complete history of a sample’s behavior during a
- [Products](https://akrometrix.com/products/) - Explore our products line of Thermal and Room Temperature Warpage systems, featuring a variety of options for In-lab testing or the Production floor.
- [Privacy Policy](https://akrometrix.com/privacy-policy/) - Our privacy policy respects your right to privacy and your right to limit information exchanges to only those you initiate, if you so desire.
- [Board of Directors](https://akrometrix.com/board-of-directors/) - The Board of Directors of Akrometrix, LLC the global leader of Thermal and Room Temperature Solutions andTesting Services for Warpage, Strain and CTE analysis.
- [Sales](https://akrometrix.com/representatives/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. Our representatives extend across Asia, Europe, North America, & South America.
- [Industry Standards and Downloads](https://akrometrix.com/downloads/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [FAQ - Frequently Asked Questions](https://akrometrix.com/faq/) - Have questions about Thermal Warpage and Strain metrology? Want to learn more about our Warpage Solutions? Check out our Frequently Asked Questions (FAQ)
- [Part Tracking/Real Time Analysis](https://akrometrix.com/part-tracking-real-time-analysis/) - Part tracking fo the manufacturing of Thermal and Room Temperature Solutions, and provider of Testing Services for the global market.
- [Applications](https://akrometrix.com/applications/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. Our technologies provide a wide variety of component applications
- [Interface Analysis](https://akrometrix.com/interface-analysis/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [Software Products](https://akrometrix.com/software/) - Our software products are integrated to run on all Akrometrix warpage systems with the capability to set custom warpage characteristic measurements.
- [Testing Services](https://akrometrix.com/testing-services/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [Modules](https://akrometrix.com/modules/) - Vision Technology Modules for measuring Strain & CTE, discontinuous surfaces & varying step heights, sub-room warpage characteristics, and more.
- [Room Temperature Systems](https://akrometrix.com/room-temperature-systems/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [Thermal Systems](https://akrometrix.com/thermal-systems/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [TTSM-JS](https://akrometrix.com/ttsm-js/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [TTDFP2](https://akrometrix.com/ttdfp2/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [DFP2-LS](https://akrometrix.com/dfp2-ls/) - The DFP2-LS will measure the entire surface of a fully populated PCB assembly discontinuous surface with varying step heights, after the post-reflow process.
- [TTSM-J](https://akrometrix.com/ttsm-j/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [TTSM](https://akrometrix.com/ttsm-2/) - The Table Top Shadow Moiré Metrology System (TTSM) provides ultra fast surface topography for substrates up to 330mm x 330mm.
- [PS200S](https://akrometrix.com/ps200s/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [PS600S](https://akrometrix.com/ps600s/) - The PS600S utilizes Shadow Moiré measurement technique with automated phase-stepping to characterize out-of-plane displacement for samples up to 600 mm x 600 mm
- [PS600T](https://akrometrix.com/ps600t/) - PS600T Thermal Warpage System Technical Specs The TherMoiré® PS600T is a modular metrology solution that utilizes the Shadow Moiré measurement technique,combined with automated phase-stepping, to characterize out-of-planedisplacement for samples up to 600 mm x 600 mm. With time-temperatureprofiling capability, the TherMoiré® PS600T captures a complete history of a sample’s behavior during a user-defined thermal profile. The combination
- [Measurement Vision Technologies](https://akrometrix.com/measurement-vision-technologies/) - Akrometrix's Measurement Vision Technologies combine the tools we use, the process we follow, and the technology we apply to provide unique solutions.
- [AXP 2.0-DIC](https://akrometrix.com/axp-2-0-dic/) - The AXP 2.0-DIC uses the Digital Imaging Correlation technique to measure any product with a discontinuous surface and varying step heights.
- [AXP 2.0-DFP2](https://akrometrix.com/axp-2-0-dfp2/) - The AXP 2.0-DFP2 uses the Digital Fringe Projection 2 technique to measure any products with a discontinuous surface and varying step heights.
- [AXP 2.0](https://akrometrix.com/axp-2-0/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [Nufesa Labs](https://akrometrix.com/nufesa-labs/) - Nufesa Labs brings Warpage Testing Services utilizing the Akrometrix AXP 2.0 Thermal Warpage System with Shadow Moiré Vision Technology to the European Market
- [z- Akrometrix University Home](https://akrometrix.com/home/) - ABOUT COURSES LIBRARY Akrometrix University is a free, online learning course designed to provide engineers with a comprehensive understanding of Thermal Warpage and Strain Metrology. Our training modules walk students through the basics of utilizing the Akrometrix Studio software and extrapolate more in-depth uses and applications. Start learning today! LESSON PLAN FEATURES: Offered by: Akrometrix LLC
- [Schedule a Meeting](https://akrometrix.com/schedule-a-meeting/) - Schedule a meeting with Akrometrix to learn about how we manufacture and provide warpage solutions, as well as testing services for the global market.
- [Studio 9.0 Discount](https://akrometrix.com/studio-9-discount/) - Introducing new Akrometrix Studio 9.0 software update! From now to September 3rd, 2022, register to get 20% off purchase. Must register to qualify for Studio 9.
- [A Closer Look](https://akrometrix.com/a-closer-look/) - A closer look at how Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions, as well as provides Testing Services for the global Market
- [Email Unsubscribe](https://akrometrix.com/email-unsubscribe/) - Akrometrix, LLC manufactures and sells Thermal and Room Temperature Solutions. We also provide Testing Services for Warpage, Strain and CTE analysis.
- [Cart](https://akrometrix.com/cart/)
- [Checkout](https://akrometrix.com/checkout/)
- [Instructor Registration](https://akrometrix.com/instructor-registration/) - Oooh! Access Denied You do not have access to this area of the application. Please refer to your system administrator. Go to Home
- [Dashboard](https://akrometrix.com/dashboard/)
- [Student Registration](https://akrometrix.com/student-registration/) - Oooh! Access Denied You do not have access to this area of the application. Please refer to your system administrator. Go to Home

## My Templates

- [Default Kit](https://akrometrix.com/?elementor_library=default-kit)
- [Landing Page Template](https://akrometrix.com/?elementor_library=landing-page-template) - Contact Our Team THERMAL & ROOM TEMPERATURE WARPAGE SYSTEMS Akrometrix is the industry leader in real-time metrology at all levels of electronic materials production, components fabrication and assembly processes OVER 350 SYSTEMS INSTALLED AROUND THE WORLD We’re partnering with Nufesa Labs to bring Thermal Warpage Testing Services, utilizing the Akrometrix AXP 2.0 Thermal Warpage System,
- [News Room Page](https://akrometrix.com/?elementor_library=news-room-page) - Akrometrix is the leading manufacturer of warpage solutions for the R&D Lab, SMT production lines, as well as a provider of Testing Services for our customers. We utilize Shadow Moiré, Digital Fringe Projection, and Digital Image Correlation vision technologies. Our technologies are capable of measuring warpage of electronic components and PCB assemblies, from sub-freezing to
- [Nufesa labs landing page](https://akrometrix.com/?elementor_library=nufesa-labs-landing-page) - Solving Tomorrow's Problems Today Nufesa Labs provides a quick and close service based on the needs of our customers in Spain and the rest of Europe with a focus on the PCB market. Get Started SERVICES ABOUT PARTNERS CONTACT Lab Services, Training Courses & ESD Audits Lab Services: X-rays, cross sections, solderability testing, stress testing, ionic
- [27 Akrometrix News Room Page](https://akrometrix.com/?elementor_library=27-akrometrix-news-room-page) - CONNECT WITH US AT SMTA International Akrometrix is the leading manufacturer of warpage solutions for the R&D Lab, SMT production lines, as well as a provider of Testing Services for our customers. We utilize Shadow Moiré, Digital Fringe Projection, and Digital Image Correlation vision technologies. Our technologies are capable of measuring warpage of electronic components
- [26 Akrometrix Representatives Page](https://akrometrix.com/?elementor_library=26-akrometrix-representatives-page) - Global representative team Accelonix Limited Ian Branchflower ian.blanchflower@accelonix.fr+44(0)1223 659965 Unit 2, McClintock BuildingGranta Park, Great Abington, Cambridge, CB21 6GP Acerbi Power S.r.l. Heber Cagnanainfo@acerbipower.com39 02 49692 127 Via dei Mille, 25, 20090 Corsico MI, Italy Baja Rep Gustavo Lachigustavo@bajarep.com(619)-772 6595 9870 Marconi Drive San Diego, CA 92154 Cerma Precision, Inc. Teiji Araiarai@cerma.co.jp03-5621-5581 135-004116-1 Fuyuki, Koto-ku,
- [25 Akrometrix Privacy Policy Page](https://akrometrix.com/?elementor_library=25-akrometrix-privacy-policy-page) - Privacy Policy Our privacy policy respects your right to privacy and your right to limit information exchanges to only those you initiate, if you so desire. We do acquire certain personal information from private individuals in the course of business, and may at times share this personal information with our partners. We use this information
- [24 Akrometrix Board of Directors Page](https://akrometrix.com/?elementor_library=24-akrometrix-board-of-directors-page) - Board of directors Timothy J. Purdie Chairman of the Board Taking over the role of Chairman of the Board from the former Prof. Charles Ume, Timothy J. Purdie brings a solid track record of success and over 29 years of experience to his role on the Akrometrix Board of Directors. Timothy served as President and
- [23 Akrometrix About Page](https://akrometrix.com/?elementor_library=23-akrometrix-about-page) - About AKROMETRIX As the Global Leader in Thermal Warpage and Strain Metrology, we provide Warpage Metrology Systems and In-House Testing Services. Company History Akrometrix is a Georgia based company founded in 1994 to provide services and equipment to measure and resolve thermo-mechanical surface flatness issues in manufacturing and assembly operations, most notably in the production
- [22 Akrometrix Industry Standards](https://akrometrix.com/?elementor_library=22-akrometrix-industry-standards) - Downloads Studio Versions Interface Analysis Computer Image Files [table id=StudioDownloads /] DOWNLOADS (cont.) Spare Parts List: SparePartsList_web_2021-06-17 Interface Analysis: Required: Microsoft Visual C++ 2015 Redistributable and Visual C++ 2010 SP1 Redistributable Package Interface Analysis – 32 bit: Akrometrix Interface Analysis 1.0.9999 x86 Interface Analysis – 64 bit: Akrometrix Interface Analysis 1.0.9999 x64 System User Manuals: 40-5000-6900 AXP 2.0 User Manual
- [21 Akrometrix FAQ Page](https://akrometrix.com/?elementor_library=21-akrometrix-faq-page) - Frequently Asked Questions - FAQ Optical Measurement Techniques How does Akrometrix measure warpage and in-plane strain/CTE? Akrometrix uses two full-field optical techniques to measure warpage: Shadow Moiré and Digital Fringe Projection (DFP). A third technique, Digital Image Correlation (DIC) is used to measure in-plane strain/CTE. The best choice for a particular application depends on a
- [20 Akrometrix Testing Services Page](https://akrometrix.com/?elementor_library=20-akrometrix-testing-services-page) - THERMAL WARPAGE TESTING SERVICES Test Services Application Process 1. Download our Test Services Sample Information Form 2. Complete form according to the sample information 3. Email form to: sales@akrometrix.com Our applications engineering experts will provide you with accurate and timely information for all your Thermal Warpage and Strain Metrology needs. Need Assistance? Contact us at sales@akrometrix.com
- [19 Akrometrix Part Track/Real Time Page](https://akrometrix.com/?elementor_library=19-akrometrix-part-track-real-time-page) - PART TRACKING The capability to measure all samples independently within the system’s field of view and automatically Locate, Crop, and Rotate the measured Samples Part Tracking Technology is a software feature included in Akrometrix Surface Measurement that increases system throughput while reducing user to user and system to system measurement variation. Part Tracking uses edge recognition technology to
- [18 Akrometrix Applications Page](https://akrometrix.com/?elementor_library=18-akrometrix-applications-page) - COMPONENT Testing BGA/LGAs Package on Package (PoP) QFN/QFP/Die Component testing is the most common use case for Akrometrix equipment. Akrometrix systems can test a large variety of component sizes and shapes through temperature. This testing is most commonly done on the attach side of components, with solder balls removed in the case of solder ball
- [17 Akrometrix Interface Analysis Page](https://akrometrix.com/?elementor_library=17-akrometrix-interface-analysis-page) - Interface Analysis An optional Studio software package that calculates the resulting warpage characteristics of two independent mating surfaces. Surface-mount components warp during the reflow process, and the area where they attach also changes shape during assembly. This interface between components is where solder, paste, and gaps created due to thermal expansion combine to create 100%
- [16 Akrometrix Software Products Page](https://akrometrix.com/?elementor_library=16-akrometrix-software-products-page) - Studio Software Akrometrix Studio is an advanced software package integrated to run on all Akrometrix Warpage Systems and offers users the capability to set up various custom warpage characteristic measurements. Profile Generator: (Create Temperature Profiles) Create thermal profiles graphically; ‘click’ to add temperature points and actions Assign ramp rates, soak times and cool down periods
- [15 Akrometrix DFP2-LS Page](https://akrometrix.com/?elementor_library=15-akrometrix-dfp2-ls-page) - DFP2-LS Large format End-of-Line Warpage System The days of measuring coplanarity with mechanical shim gauges at a few select points are gone. With the DFP2-LS End-of-Line Warpage system, coplanarity is measured across the entire surface of a fully populated PCB assembly after the post-reflow process. Utilizing Akrometrix newly released Digital Fringe Projection (DFP2) vision system,
- [14 Akrometrix TTSM-JS](https://akrometrix.com/?elementor_library=14-akrometrix-ttsm-js) - TTSM w/ JEDEC Tray Autoloader and Scanner The TTSM-JS provides ultra fast surface topography for up to two JEDEC trays full of samples. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM-JS is designed for those customers who need to measure various substrates for warpage in less than 2 seconds. Akrometrix’s suite of software programs to
- [13 Akrometrix TTSM-J Page](https://akrometrix.com/?elementor_library=13-akrometrix-ttsm-j-page) - TTSM w/ JEDEC Tray Autoloader The TTSM-J provides ultra fast surface topography for up to two JEDEC trays full of samples. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM is designed for those customers who need to measure various substrates for warpage in less than 2 seconds. Akrometrix’s suite of software programs to allow for
- [12 Akrometrix TTSM Page](https://akrometrix.com/?elementor_library=12-akrometrix-ttsm-page) - Table Top Shadow Moiré The TTSM (Table Top Shadow Moiré) Metrology System provides ultra fast surface topography for substrates up to 330mm x 330mm. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM is designed for those customers who need to measure various substrates for its warpage in less than 2 seconds. With a z-resolution of
- [11 Akrometrix PS200S Page](https://akrometrix.com/?elementor_library=11-akrometrix-ps200s-page) - PS200s thermal warpage system The TherMoiré® PS200S is a metrology solution that utilizes the Shadow Moiré measurement technique combined with automated phase-stepping to characterize out-of-plane displacement forsamples up to 150 mm x 200 mm. With time-temperature profiling capability, the TherMoiré® PS200S captures a complete history of a sample’s behavior during a user-defined thermal excursion. The combination of the
- [10 Akrometrix PS600S Page](https://akrometrix.com/?elementor_library=10-akrometrix-ps600s-page) - PS600S Thermal Warpage System The TherMoiré® PS600S is a metrology solution that utilizes the Shadow Moiré measurement technique combined with automated phase-stepping to characterize out-of-plane displacement for samples up to 600 mm x 600 mm. With time-temperature profiling capability, the TherMoiré® PS600S captures a complete history of a sample’s behavior during a user-defined thermal excursion. The combination of the
- [9 Akrometrix AXP 2.0-DIC Page](https://akrometrix.com/?elementor_library=9-akrometrix-axp-2-0-dic-page) - AXP 2.0-DIC Warpage System The AXP 2.0 Thermal Warpage System with Second Generation Digital Image Correlation Vision Technology (DIC) uses the Digital Imaging Correlation technique to measure a field of view up to 240mm x 192mm and down to 45mm x 36mm, with a measurement resolution down to 2.5 microns and 18 micron pixel sizes.
- [8 Akrometrix AXP 2.0-DFP Page](https://akrometrix.com/?elementor_library=8-akrometrix-axp-2-0-dfp-page) - AXP 2.0-DFP2 Warpage System The AXP 2.0 Thermal Warpage System with Second Generation Digital Fringe Projection Vision Technology (DFP2) uses the Digital Fringe Projection 2 technique to measure a field of view up to 240mm x 192mm and down to 45mm x 36mm, with a measurement resolution down to 2.5 microns and 18 micron pixel
- [7 Akrometrix AXP 2.0 Page](https://akrometrix.com/?elementor_library=7-akrometrix-axp-2-0-page) - AXP 2.0 Thermal Warpage System The TherMoiré® AXP 2.0 is a modular metrology solution that utilizes the Shadow Moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400 mm x 400 mm. With time-temperature profiling capability, the TherMoiré® AXP 2.0 captures a complete history of a sample’s behavior during a user-defined thermal
- [6 Akrometrix Modules Page](https://akrometrix.com/?elementor_library=6-akrometrix-modules-page) - DIC 2.0 Module Optional Vision Technology Module for all Akrometrix Thermal Warpage systems for the purpose of measuring Strain & CTE. Digital Image Correlation (DIC) is a non-contact, full-field opticaltechnique for measuring both in-plane and out-of-plane displacements of an object surface. A high contrast, random speckle pattern is applied to the surface of interest. Two cameras
- [5 Akrometrix Vision Tech Page](https://akrometrix.com/?elementor_library=5-akrometrix-vision-tech-page) - Vision Measurement Technologies Some manufacturers of metrology systems utilize one single technology to measure a wide range of components, despite the different form factor of each of the components, which can drastically affect the quality of the measurement. At Akrometrix, we take the time to understand the problem and the objectives you are trying to
- [4 Akrometrix Room Temp Systems Page](https://akrometrix.com/?elementor_library=4-akrometrix-room-temp-systems-page) - Room Temperature Warpage Systems Ideal Warpage Solution for Production Floor Environments. Available in both stand alone and in-line SMT solutions. TTSM The Table Top Shadow Moiré (TTSM) is a Production Floor Warpage Metrology System designed for quick and easy measurements, utilizing Akrometrix’s suite of software programs to allow for a variety of useful features to
- [3 Akrometrix Thermal Systems Page](https://akrometrix.com/?elementor_library=3-akrometrix-thermal-systems-page) - Thermal Warpage Systems Ideal for the R&D development of NPI’s, replicating the Warpage characteristics of the Reflow Production Process AXP 2.0 The TherMoiré® AXP 2.0 is a modular metrology solution that utilizes the shadow moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400mm x 400mm | Learn more AXP 2.0-DFP2
- [2 Akrometrix Products Page](https://akrometrix.com/?elementor_library=2-akrometrix-products-page) - Room Temperature Warpage Systems Explore Thermal Warpage Systems Explore
- [1 Akrometrix Homepage](https://akrometrix.com/?elementor_library=1-akrometrix-homepage) - THE GLOBAL LEADER IN WARPAGE METROLOGY SOLUTIONS We manufacture, sell, & provide Thermal and Room Temperature Warpage System Solutions, as well as Testing Services for Warpage, Strain and Coefficient of Thermal Expansion (CTE) analysis GET IN CONTACT WITH OUR TEAM Thermal Systems AXP 2.0 AXP 2.0-DFP2 PS600S PS200S Explore Room Temp Systems TTSM TTSM-J TTSM-JS
- [Lesson Page Template](https://akrometrix.com/?elementor_library=lesson-page-template) - Module 1 | Room Temperature Metrology 3 Lessons • 3 Quizzes • 1 Final Assessment This module will review the enhancements to the Akrometrix Studio Surface Measurement and Thermal Profiler, which enable TherMoiré users to measure significantly more sample parts at once than was previously feasible. The lessons will also explain the revolutionary nature of
- [akrou part tracking](https://akrometrix.com/?elementor_library=akrou-part-tracking) - Introduction to High Volume Testing with Part Tracking Module Overview 6 Lessons • 6 Quizzes • 1 Final Assessment > This module will review the enhancements to the Akrometrix Studio Surface Measurement and Thermal Profiler, which enable TherMoiré users to measure significantly more sample parts at once than was previously feasible, while also decreasing the
- [Akro U Library](https://akrometrix.com/?elementor_library=akro-u-library-2) - Akrometrix University | Library BACK TO MAIN | Akrometrix Resources | External Resources 2019 High Temperature Component Warpage as a Function of Moisture Sensitivity (MSL) Rating As originally published in SMTAI 2019 Proceedings | Neil Hubble 2018 Thermal Shadow Moire to Cross-Section Correlation Study As originally published in SMTAI 2018 Proceedings | Jorge Arellano, Edgardo
- [Akro U Library](https://akrometrix.com/?elementor_library=akro-u-library) - Akrometrix University | Library
- [Akrometrix University_Page2](https://akrometrix.com/?elementor_library=akrometrix-university_page2) - Module 1 Complete Continue to Lesson 2 “Goals are the fuel in the furnace of achievement.” — Brian Tracy World Headquarters 2700 NE ExpresswayBuilding B, Suite 500Atlanta, Georgia 30345 Tel: 404-486-0880Fax: 404-486-0890 Twitter Linkedin Envelope
- [Akrometrix University_Page3](https://akrometrix.com/?elementor_library=akrometrix-university_page3) - Introduction to High Volume Testing with Part Tracking Module Overview > 6 Lessons • 6 Quizzes • 1 Final Assessment > This Module will review the enhancements to the Akrometrix Studio Surface Measurement and Thermal Profiler, which enable TherMoiré users to measure significantly more sample parts at once than was previously feasible, while also decreasing the
- [Discount Form](https://akrometrix.com/?elementor_library=discount-form) - register by June 30th to qualify for 10% Off TESTING SERVICES up to $5000 | Limited time offer GET YOUR DISCOUNT TODAY! * required fields
- [Akro_Post Template](https://akrometrix.com/?elementor_library=akro_post-template) - Akrometrix Wins a 2017 NPI Award for Its Next Generation AXP Shadow Moiré System at APEX ATLANTA, GA ― February 15 2017 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, is pleased to announce that it has been awarded a
- [Studio 10.1 Release Post](https://akrometrix.com/?elementor_library=studio-10-1-release-post) - Akrometrix Studio Version 10.1 Release ATLANTA, GA ― January 14th, 2026 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, announces their new Studio 10.1 update. Akrometrix Studio version 10.1 is now available and introduces: Profile gauges for validating reflow emulation against
- [DFP3 Release Post](https://akrometrix.com/?elementor_library=dfp3-release-post) - Akrometrix Announces the Next Generation Digital Fringe Projection Metrology Tool, the DFP3 Module ATLANTA, GA ― December 11, 2026 ― Akrometrix, LLC, the leading provider of Thermal Warpage and Strain Metrology Equipment for the semiconductor and electronics industries, recently announced the next generation in digital fringe projection (DFP) thermal warpage metrology with its DFP3 module.
- [DIC3 Release Post](https://akrometrix.com/?elementor_library=dic3-release-post) - Akrometrix Announces Next Generation Thermal Strain and CTE Measurement Tool the DIC3 Module ATLANTA, GA ― December 11, 2026 ― Akrometrix, LLC, the leading provider of Thermal Warpage and Strain Metrology Equipment for semiconductor and electronics industries, recently announced the next generation in thermal strain metrology with its DIC3 module. The tool significantly improves data
- [News and Updates](https://akrometrix.com/?elementor_library=news-and-updates) - News Room Latest updates from Akrometrix: product releases, thermal metrology innovations, and press mentions. New Studio 10.1 Software Release and Updates January 14, 2026 Read More Akrometrix Announces the Next Generation Digital Fringe Projection Metrology Tool, the DFP3 Module January 8, 2026 Read More Akrometrix Announces Next Generation Thermal Strain Measurement Tool the DIC3 December
- [Post Template](https://akrometrix.com/?elementor_library=post-template) - New TTDFP2 Room Temperature System ATLANTA, GA ― August 11st, 2022 ― Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced its Table Top Digital Fringe Projection 2 Room Temperature System (TTDFP2). The TTDFP2 provides fast and accurate surface topography
- [Sales-01072026](https://akrometrix.com/?elementor_library=sales-01072026) - Global representatives North America Representatives Akrometrix HQ Paul HandlerDirector of Sales +1 (678) 427-6116phandler@akrometrix.com 2700 NE ExpresswayBuilding B, Suite 500Atlanta, Georgia 30345 GD Mexico Omar Granados 3311166559omar.granados@indicomx.com Indicomx.com Murray Percival Company Murray Percival Jr. (800) 405-1730 ext. 2029 2014 Brown RdAuburn Hills, MI 48326 Sparks Electronics Tim Sparks 770-856-5780sparks@spelcon.com 1700 NW 97TH AVE.#228541Doral, FL, 33172
- [company-01072026](https://akrometrix.com/?elementor_library=company-01072026) - About AKROMETRIX As the Global Leader in Thermal Warpage and Strain Metrology, we provide Warpage Metrology Systems and In-House Testing Services. Company History Akrometrix is a Georgia based company founded in 1994 to provide services and equipment to measure and resolve thermo-mechanical surface flatness issues in manufacturing and assembly operations, most notably in the production
- [FQA-01072026](https://akrometrix.com/?elementor_library=fqa-01072026) - Frequently Asked Questions - FAQ Optical Measurement Techniques How does Akrometrix measure warpage and in-plane strain/CTE? Akrometrix uses two full-field optical techniques to measure warpage: Shadow Moiré and Digital Fringe Projection (DFP). A third technique, Digital Image Correlation (DIC) is used to measure in-plane strain/CTE. The best choice for a particular application depends on a
- [Parttracking-01062026](https://akrometrix.com/?elementor_library=parttracking-01062026) - PART TRACKING The capability to measure all samples independently within the system’s field of view and automatically Locate, Crop, and Rotate the measured Samples Part Tracking Technology is a software feature included in Akrometrix Surface Measurement that increases system throughput while reducing user to user and system to system measurement variation. Part Tracking uses edge recognition technology to
- [TestingServices-01062026](https://akrometrix.com/?elementor_library=testingservices-01062026) - THERMAL WARPAGE TESTING SERVICES Test Services Application Process 1. Download our Test Services Sample Information Form 2. Complete form according to the sample information 3. Email form to: testingservices@akrometrix.com Our Technical Overview Document provides a complete look at the kinds of samples we test: Overview PDF Testing Service Request If you have any questions, our
- [ThermalSystems-01062026](https://akrometrix.com/?elementor_library=thermalsystems-01062026) - Thermal Warpage Systems Ideal for the R&D development of NPI's, replicating the Warpage characteristics of the Reflow Production Process AXP 3 The TherMoiré® AXP 3 is a modular metrology solution that utilizes the shadow moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400mm x 400mm | Learn more PS600T The TherMoiré®
- [ModulesStagin-01062026](https://akrometrix.com/?elementor_library=modulesstagin-01062026) - DIC3 Module Optional Vision Technology Module for all Akrometrix Thermal Warpage systems for the purpose of measuring Strain & CTE. Digital Image Correlation (DIC) is a non-contact, full-field optical method for measuring in-plane displacement on a speckle-patterned surface. Stereo cameras mounted above the oven capture simultaneous images of the sample. The software identifies matching speckle
- [TTDFP2-01062026](https://akrometrix.com/?elementor_library=ttdfp2-01062026-3) - Table Top digital fringe projection 2 Technical Specs The Table Top Digital Fringe Projection 2 (TTDFP2) system provides fast and accurate surface topography for discontinuous surfaces at room temperature. The TTDPF2 accommodates samples up to 450mm x 450mm, with a variable field of vision ranging from 45 x 36mm to 192 x 240mm. The TTDFP2
- [TTDFP2-01062026](https://akrometrix.com/?elementor_library=ttdfp2-01062026-2) - Table Top digital fringe projection 2 Technical Specs The Table Top Digital Fringe Projection 2 (TTDFP2) system provides fast and accurate surface topography for discontinuous surfaces at room temperature. The TTDPF2 accommodates samples up to 450mm x 450mm, with a variable field of vision ranging from 45 x 36mm to 192 x 240mm. The TTDFP2
- [Modules Page | DFP2 Section](https://akrometrix.com/?elementor_library=modules-page-dfp2-section) - The DFP2 Module is an add-on module for the AXP3, AXP 2.0 and PS600S models. The module uses the Digital Fringe Projection technique to measure a field of view up to 240x192mm and down to 45x36mm with a measurement resolution down to 2.5 microns and 18 micron pixel sizes. The DFP2 Module can be quickly installed on
- [Modules Page | DPF3 Section](https://akrometrix.com/?elementor_library=modules-page-dpf3-section) - Digital Fringe Projection is a complementary vision measurement technique to Shadow Moiré that uses projected fringes rather than grating moiré lines, with the specific benefit of measuring discontinuous surfaces. This technique is particularly useful for measuring connectors, sockets, BGA balls, and assembled modules. | Learn More The DFP3 module features a 16MP camera and a
- [TTDFP2-01062026](https://akrometrix.com/?elementor_library=ttdfp2-01062026) - Table Top digital fringe projection 2 Technical Specs The Table Top Digital Fringe Projection 2 (TTDFP2) system provides fast and accurate surface topography for discontinuous surfaces at room temperature. The TTDPF2 accommodates samples up to 450mm x 450mm, with a variable field of vision ranging from 45 x 36mm to 192 x 240mm. The TTDFP2
- [DFP2-LS-01052026](https://akrometrix.com/?elementor_library=dfp2-ls-01052026) - DFP2-LS Large format End-of-Line Warpage System Technical Specs The days of measuring coplanarity with mechanical shim gauges at a few select points are gone. With the DFP2-LS End-of-Line Warpage system (DFP2-LS), coplanarity is measured across the entire surface of a fully populated PCB assembly after the post-reflow process. Utilizing Akrometrix Digital Fringe Projection (DFP2) vision
- [TTSM-JS-01052026](https://akrometrix.com/?elementor_library=ttsm-js-01052026) - TTSM w/ JEDEC Tray Autoloader and Scanner Technical Specs The TTSM-JS provides ultra fast surface topography for up to two JEDEC trays full of samples. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM-JS is designed for those customers who need to measure various substrates for warpage in less than 2 seconds. Akrometrix’s suite of software
- [TTSMJ-01052026](https://akrometrix.com/?elementor_library=ttsmj-01052026) - TTSM w/ JEDEC Tray Autoloader Technical Specs The Table Top Shadow Moiré Metrology System with JEDEC Tray Autoloader (TTSM-J) provides ultra fast surface topography for up to two JEDEC trays full of samples. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM is designed for those customers who need to measure various substrates for warpage in less
- [TTSM-01052026](https://akrometrix.com/?elementor_library=ttsm-01052026) - Table Top Shadow Moiré Technical Specs The Table Top Shadow Moiré Metrology System (TTSM) provides ultra fast surface topography for substrates up to 330mm x 330mm. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM is designed for those customers who need to measure various substrates for its warpage in less than 2 seconds. With a z-resolution
- [room-temperature-systems-01052026](https://akrometrix.com/?elementor_library=room-temperature-systems-01052026) - Room Temperature Warpage Systems Ideal Warpage Solution for Production Floor Environments. Available in both stand alone and in-line SMT solutions TTSM The Table Top Shadow Moiré (TTSM) is a Production Floor Warpage Metrology System designed for quick and easy measurements, utilizing Akrometrix’s suite of software programs to allow for a variety of useful features to
- [PS600S-01052026](https://akrometrix.com/?elementor_library=ps600s-01052026) - PS600S Thermal Warpage System Technical Specs The TherMoiré® PS600S is a metrology solution that utilizes the Shadow Moiré measurement technique combined with automated phase-stepping to characterize out-of-plane displacement for samples up to 600 mm x 600 mm. With time-temperature profiling capability, the TherMoiré® PS600S captures a complete history of a sample’s behavior during a user-defined thermal excursion. The combination
- [PS600T-01052026](https://akrometrix.com/?elementor_library=ps600t-01052026) - PS600T Thermal Warpage System Technical Specs The TherMoiré® PS600T is a modular metrology solution that utilizes the Shadow Moiré measurement technique,combined with automated phase-stepping, to characterize out-of-planedisplacement for samples up to 600 mm x 600 mm. With time-temperatureprofiling capability, the TherMoiré® PS600T captures a complete history of a sample’s behavior during a user-defined thermal profile. The combination
- [AXP3-01052026](https://akrometrix.com/?elementor_library=axp3-01052026) - AXP 3 Thermal Warpage System Technical Specs The TherMoiré® AXP 3 is a modular metrology solution that utilizes the Shadow Moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400 mm x 400 mm. With time-temperature profiling capability, the TherMoiré® AXP 3 captures a complete history of a sample’s behavior during a
- [templateDontuse](https://akrometrix.com/?elementor_library=templatedontuse) - Room Temperature Warpage Systems Ideal Solutions for Production Floor Environments. Available in both stand-alone and in-line SMT solutions. TTSM TTSM-J TTDFP2 TTSM-JS DFP2-LS Thermal Warpage Systems Ideal Solutions for the R&D development of NPI's, replicating the warpage characteristics of the Reflow Production Process AXP3 PS600S PS200S Equipment Request Notice: JavaScript is required for this content.
- [ModulesUpdated](https://akrometrix.com/?elementor_library=modulesupdated) - DIC3 Module Optional Vision Technology Module for all Akrometrix Thermal Warpage systems for the purpose of measuring Strain & CTE. Digital Image Correlation (DIC) is a non-contact, full-field optical method for measuring in-plane displacement on a speckle-patterned surface. Stereo cameras mounted above the oven capture simultaneous images of the sample. The software identifies matching speckle
- [MeasurementVisionTechUpdated](https://akrometrix.com/?elementor_library=measurementvisiontechupdated) - Vision Measurement Technologies Some manufacturers of metrology systems utilize one single technology to measure a wide range of components, despite the different form factor of each of the components, which can drastically affect the quality of the measurement. At Akrometrix, we take the time to understand the problem and the objectives you are trying to
- [room-temperature-systemsUpdated](https://akrometrix.com/?elementor_library=room-temperature-systemsupdated) - Room Temperature Warpage Systems Ideal Warpage Solution for Production Floor Environments. Available in both stand alone and in-line SMT solutions TTSM The Table Top Shadow Moiré (TTSM) is a Production Floor Warpage Metrology System designed for quick and easy measurements, utilizing Akrometrix’s suite of software programs to allow for a variety of useful features to
- [HomeTemplate12122025](https://akrometrix.com/?elementor_library=hometemplate12122025-2) - OVER 450 SYSTEMS INSTALLED IN 22 COUNTRIES AROUND THE WORLD Our Representatives Team extends across Asia, Europe, North America & South America Have Questions? Contact Our Team: CONTACT Thermal Systems AXP 3 PS600T PS600S PS200S Explore Room Temp Systems TTSM TTSM-J TTSM-JS DFP2-LS TTDFP2 Explore Testing Services Thermal Reflow Profiling Sub-Room Interface Analysis CTE Measurement
- [HomeTemplate12122025](https://akrometrix.com/?elementor_library=hometemplate12122025) - OVER 450 SYSTEMS INSTALLED IN 22 COUNTRIES AROUND THE WORLD Our Representatives Team extends across Asia, Europe, North America & South America Have Questions? Contact Our Team: CONTACT Thermal Systems AXP 3 PS600T PS600S PS200S Explore Room Temp Systems TTSM TTSM-J TTSM-JS DFP2-LS TTDFP2 Explore Testing Services Thermal Reflow Profiling Sub-Room Interface Analysis CTE Measurement
- [HomeTemplateBackupBeforeMigration](https://akrometrix.com/?elementor_library=hometemplatebackupbeforemigration) - OVER 450 SYSTEMS INSTALLED IN 22 COUNTRIES AROUND THE WORLD Our Representatives Team extends across Asia, Europe, North America & South America Have Questions? Contact Our Team: CONTACT Thermal Systems AXP 3 PS600T PS600S PS200S Explore Room Temp Systems TTSM TTSM-J TTSM-JS DFP2-LS TTDFP2 Explore Testing Services Thermal Reflow Profiling Sub-Room Interface Analysis CTE Measurement
- [PS200S_12042025](https://akrometrix.com/?elementor_library=ps200s_12042025) - PS200s thermal warpage system Technical Specs The TherMoiré® PS200S is a metrology solution that utilizes the Shadow Moiré measurement technique combined with automated phase-stepping to characterize out-of-plane displacement forsamples up to 150 mm x 200 mm. With time-temperature profiling capability, the TherMoiré® PS200S captures a complete history of a sample’s behavior during a user-defined thermal excursion. The combination
- [Press Release Body](https://akrometrix.com/?elementor_library=press-release-body) - ATLANTA, GA ― February 18, 2025 ― Professor Ifeanyi Charles Ume founded Akrometrix out of Georgia Tech 30 years ago, to address issues in PCB flatness, using the shadow moiré warpage measurement technique. These early concepts evolved into industry standards for measuring applications within the semiconductor industry, most often while samples were subject to temperature
- [Hero Section](https://akrometrix.com/?elementor_library=hero-section) - Akrometrix Announces Next Generation Thermal Warpage Measurement System AXP3
- [Product Page](https://akrometrix.com/?elementor_library=product-page) - [product Name] The TherMoiré® PS600T is a modular metrology solution that utilizes the Shadow Moiré measurement technique,combined with automated phase-stepping, to characterize out-of-planedisplacement for samples up to 600 mm x 600 mm. With time-temperatureprofiling capability, the TherMoiré® PS600T captures a complete history of a sample’s behavior during a user-defined thermal profile. The combination of Shadow Moiré measurement and
- [Akrometrix Behind the Scenes Hero Section](https://akrometrix.com/?elementor_library=akrometrix-behind-the-scenes-hero-section) - The Global Leader in THERMAL WARPAGE AND STRAIN METROLOGY SOLUTIONs Now Featuring on Behind the Scenes on PBS Behind the Scenes with Laurence Fishburne is an award-winning program that highlights new stories and innovative concepts through groundbreaking short-form and long-form documentary presentation. Their objective is to merge creativity and technology in order to foster organic

## Lessons

- [What is warpage?](https://akrometrix.com/courses//lesson/what-is-warpage/) - Warpage is the extent or result of being bent or twisted out of shape, typically as a result of the effects of heat or damp.
- [Digital Fringe Projection](https://akrometrix.com/courses//lesson/digital-fringe-projection/)
- [Shadow Moire](https://akrometrix.com/courses//lesson/shadow-moire/)

## Quizzes

- [Quiz](https://akrometrix.com/courses//quizzes/quiz/)
- [Intro to Warpage Quiz](https://akrometrix.com/courses/intro-to-warpage-quiz/quizzes/intro-to-warpage-quiz/)

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